Soft X-ray spectromicroscopy development for materials science at the Advanced Light Source
نویسندگان
چکیده
منابع مشابه
A scanning transmission x-ray microscope for materials science spectromicroscopy at the advanced light source
Design and performance of a scanning transmission x-ray microscope ~STXM! at the Advanced Light Source is described. This instrument makes use of a high brightness undulator beamline and extends the STXM technique to new areas of research. After 2.5 years of development it is now an operational tool for research in polymer science, environmental chemistry, and magnetic materials. © 1998 America...
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In this paper, we report initial test results of a four-bounce Bragg reflection Xray interferometer at 7.46 keV and, for the first time to our knowledge, at the higher energy of 14.91 keV where the spectral acceptance is much smaller. INTRODUCTION The triple Laue (LLL) interferometer is one of the most used X-ray interferometers, be it in ultra-precision metrology’ or in imaging techniques. The...
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ژورنال
عنوان ژورنال: Journal of Electron Spectroscopy and Related Phenomena
سال: 1997
ISSN: 0368-2048
DOI: 10.1016/s0368-2048(97)00026-1